Machine Vision Software
Development Kit (SDK)
OdinVision SDK
Empowering developers to streamline the building and deployment of high-performance machine vision systems.
The OdinVision SDK is a robust development kit engineered for the seamless creation and deployment of advanced machine vision systems. By leveraging the OdinVision SDK, developers can rapidly architect tailored applications that address the specific challenges of diverse industries and global stakeholders.
High Performance
Rapid Development
Cross-Platform VersatilityPre-optimized algorithms for seamless, out-of-the-box integration and faster time-to-market.
Full support for x86 and ARM architectures, ensuring flexible deployment across diverse hardware.
Continuous updates and dedicated support to maximize uptime and protect your long-term investment.
Field-proven performance in the 3C, semiconductor, automotive, and academic research sectors.
Supports full offline deployment and localized IP management for superior data privacy.
Scalable, cost-effective licensing options designed for frictionless adoption and growth.
Industrial Inspection Algorithms Deeply Optimized
Image preprocessing, positioning, recognition, measurement, inspection
Barcode Tool: Automates the localization and decoding of standard barcode symbologies.
QR Code/DataMatrix Tool: High-reliability reading of DataMatrix and QR codes with automatic localization and 360° omnidirectional rotation handling.
Extracts target quantities and geometric features (area, centroid, orientation, axes) from binary images.
Optimized for environments with uniform backgrounds and high target-to-background contrast.
Camera Calibration: Utilizes dot-matrix targets to automatically calculate intrinsic and extrinsic parameters (translation, rotation, scale, tilt).
Character Reading: Advanced tools for robust text decoding and character-level defect inspection.
Color Recognition: Identifies pre-defined color samples by analyzing spectral components and providing confidence scores.
High-speed identification using grayscale, geometric, or contour-based matching for precise part localization.
Includes edge-point detection, pitch measurement, and sophisticated line/circle fitting.
Measures dimensions and circular features with sub-pixel accuracy.
Locates single or multiple edge points with high-precision sub-pixel resolution.
Image Differencing: Identifies anomalies by comparing target images against a golden template using BLOB extraction.
Advanced BLOB Analysis: Analyzes connected regions (area, centroid, hole count, bounding box, convex hull) to classify targets or flaws.